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HIVE INF
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ARCHIVE INFORMATION
2
RF Device Data
Freescale Semiconductor
MRFG35010NT1
Table 4. Electrical Characteristics (TC
= 25
°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
Saturated Drain Current
(VDS
= 3.5 Vdc, V
GS
= 0 Vdc)
IDSS
?
2.9
?
Adc
Off State Leakage Current
(VGS
= -0.4 Vdc, V
DS
= 0 Vdc)
IGSS
?
< 1.0
100
μAdc
Off State Drain Current
(VDS
= 12 Vdc, V
GS
= -1.9 Vdc)
IDSO
?
0.1
1.0
mAdc
Off State Current
(VDS
= 28.5 Vdc, V
GS
= -2.5 Vdc)
IDSX
?
2.0
15
mAdc
Gate-Source Cut-off Voltage
(VDS
= 3.5 Vdc, I
DS
= 15 mA)
VGS(th)
-1.2
-1.0
-0.7
Vdc
Quiescent Gate Voltage
(VDS
= 12 Vdc, I
DQ
= 180 mA)
VGS(Q)
-1.2
-0.95
-0.7
Vdc
Power Gain
(VDD
= 12 Vdc, I
DQ
= 180 mA, f = 3.55 GHz)
Gps
9.0
10
?
dB
Output Power, 1 dB Compression Point
(VDD
= 12 Vdc, I
DQ
= 180 mA, f = 3.55 GHz)
P1dB
?
9
?
W
Drain Efficiency
(VDD
= 12 Vdc, I
DQ
= 180 mA, P
out
= 900 mW Avg.,
f = 3.55 GHz)
D
23
28
?
%
Adjacent Channel Power Ratio
(VDD
= 12 Vdc, P
out
= 900 mW Avg., I
DQ
= 180 mA,
f = 3.55 GHz, W-CDMA, 8.5 P/A @ 0.01% Probability,
64 CH, 3.84 MCPS)
ACPR
?
-43
-40
dBc